Materials Synthesis, Deposition, and Processing

Characterization of intrinsic ZnO thin film deposited by sputtering and its effects on CuIn1−xGaxSe2 solar cells

[+] Author Affiliations
Minlin Jiang, Xingzhong Yan

South Dakota State University, Electrical Engineering and Computer Science Department, Brookings, South Dakota 57007

Ken Tang

OPTORUN Co. Ltd., Research and Development Department, 10-1 Takeno, Kawagoe-shi, Saitama-ken, 350-0801 Japan

J. Photon. Energy. 2(1), 028502 (Jul 26, 2012). doi:10.1117/1.JPE.2.028502
History: Received December 28, 2011; Revised June 12, 2012; Accepted July 3, 2012
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Abstract.  Intrinsic ZnO (i-ZnO) thin films were deposited on glass substrates by radio-frequency magnetron sputtering for exploring the effects of the deposition conditions. These films were optically, electrically, and structurally characterized. Results showed that the properties of i-ZnO thin films changed with the changing of deposition conditions. These i-ZnO films were also integrated into CuIn1xGaxSe2 (CIGS) solar cells. It was found that the incorporation of an i-ZnO layer in CIGS solar cells led to a significant improvement of homogeneity and efficiency of CIGS solar cells. An increment of 1.71% was gained in the average cell efficiency through adjusting the deposition conditions of i-ZnO layers. Detailed analysis showed that there was no improvement in cell efficiency under the deposition conditions favorable for growing the i-ZnO films. These results indicate that there should be a balance among the optimized performance of each layer deposited for high quality multi-layer devices.

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© 2012 Society of Photo-Optical Instrumentation Engineers

Citation

Minlin Jiang ; Ken Tang and Xingzhong Yan
"Characterization of intrinsic ZnO thin film deposited by sputtering and its effects on CuIn1−xGaxSe2 solar cells", J. Photon. Energy. 2(1), 028502 (Jul 26, 2012). ; http://dx.doi.org/10.1117/1.JPE.2.028502


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