Photovoltaic Materials, Devices, and Technologies

Survey of potential-induced degradation in thin-film modules

[+] Author Affiliations
Peter Hacke, Kent Terwilliger, Stephen H. Glick, Greg Perrin, John Wohlgemuth, Sarah Kurtz

The National Center for Photovoltaics, National Renewable Energy Laboratory, 15013 Denver West Parkway, Golden, Colorado 80401, United States

Keith Showalter, John Sherwin, Eric Schneller, Stephen Barkaszi

University of Central Florida, Florida Solar Energy Center, 1679 Clearlake Road, Cocoa, Florida 32922, United States

Ryan Smith

Pordis, LLC, 12413 Mallard Lane, Austin, Texas 78729, United States

J. Photon. Energy. 5(1), 053083 (Dec 17, 2015). doi:10.1117/1.JPE.5.053083
History: Received September 4, 2015; Accepted November 9, 2015
Text Size: A A A

Abstract.  Two CdTe and two copper indium gallium (di)selenide (CIGS)-type modules were tested for potential-induced degradation (PID) with positive and negative 1000 V biases applied to the active cell circuit in an 85°C, 85% relative humidity environmental chamber. Various degradation mechanisms could be seen with signatures such as shunting, transparent conductive oxide (TCO) corrosion, charge carrier lifetime reduction, and dead active layer at edges along with resulting cell mismatch. All modules tested exhibited degradation by system voltage stress in chamber, but only one module type has degraded in parallel field tests. IV curve data indicated that one CdTe-type module sequentially exhibited shunting followed by a recovery and then series resistance losses. This module type showed TCO delamination from the glass in the environmental chamber tests and also exhibited power degradation within 5 weeks in field tests. Relative rates of Coulomb transfer from the voltage-biased active cell circuit to ground are compared for the modules in chamber tests to those placed outdoors under system voltage stress to extrapolate the anticipated time to failure in the field. This analysis correctly indicated which module type failed in the field first.

Figures in this Article
© 2015 Society of Photo-Optical Instrumentation Engineers

Citation

Peter Hacke ; Kent Terwilliger ; Stephen H. Glick ; Greg Perrin ; John Wohlgemuth, et al.
"Survey of potential-induced degradation in thin-film modules", J. Photon. Energy. 5(1), 053083 (Dec 17, 2015). ; http://dx.doi.org/10.1117/1.JPE.5.053083


Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.