Estimating relative extent of scattering loss due to sidewall roughness in slot waveguides by nw model

Yu Wang; Mei Kong

doi:10.1117/12.2505594

12 December 2018 Estimating relative extent of scattering loss due to sidewall roughness in slot waveguides by n_w model

Yu Wang, Mei Kong

Author Affiliations +

Proceedings Volume 10848, Micro-Optics and MOEMS; 108480F (2018) https://doi.org/10.1117/12.2505594
Event: International Symposium on Optoelectronic Technology and Application 2018, 2018, Beijing, China

Abstract

We apply nw model to slot waveguides with three different cladding and filling materials and calculate n_w at different structural parameters to reveal the influence of these parameters on the sidewall-roughness scattering loss. Based on the power density distribution and the mode field localization, we analyze the causes of the influence rules, which are also consistent with the trends of reported experimental data in literatures. The results of the calculation and analysis in this paper have a guiding significance for the design and processing of slot waveguides.

Citation Download Citation

Yu Wang and Mei Kong "Estimating relative extent of scattering loss due to sidewall roughness in slot waveguides by n_w model", Proc. SPIE 10848, Micro-Optics and MOEMS, 108480F (12 December 2018); https://doi.org/10.1117/12.2505594

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