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3 August 2021 Visualizing Pattern Formation in Polymer Blends Using Near-Field Vibrational Infrared Imaging
Terefe G. Habteyes, Chih-Feng Wang, Tefera Tesema, Hamed Kookhaee
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Proceedings Volume 11803, Enhanced Spectroscopies and Nanoimaging 2021; 118030A (2021) https://doi.org/10.1117/12.2594641
Event: SPIE Nanoscience + Engineering, 2021, San Diego, California, United States
Abstract
In this presentation, the molecular sensitivity of scattering-type near-field scanning optical microscopy (s-SNOM) will be demonstrated by imaging an organic thin film with thickness gradient that continuously vary from zero to over 200 nm on different substrates. We will then present recent s-SNOM experimental results that show phase separation and nanoscale pattern formation in thin films of blended polymers. The evolution of nanoscale domains and hierarchical patterns as a function of composition will be discussed. The results may help to understand the sensitivity of s-SNOM chemical imaging at the molecular “finger print” region of electromagnetic radiation and to realize the capability of the technique to resolve nanoscale domains and phase separation in multicomponent organic thin films.
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Terefe G. Habteyes, Chih-Feng Wang, Tefera Tesema, and Hamed Kookhaee "Visualizing Pattern Formation in Polymer Blends Using Near-Field Vibrational Infrared Imaging", Proc. SPIE 11803, Enhanced Spectroscopies and Nanoimaging 2021, 118030A (3 August 2021); https://doi.org/10.1117/12.2594641
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KEYWORDS
Near field scanning optical microscopy
Gold
Infrared imaging
Polymers
Visualization
Silicon
Thin films
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