Time-resolved fluorescence studies of surface recombination in CdSe electrodes

M. L. Shumaker; D. Burdelski; David H. Waldeck

doi:10.1117/12.17895

1 April 1990 Time-resolved fluorescence studies of surface recombination in CdSe electrodes

M. L. Shumaker, D. Burdelski, David H. Waldeck

Proceedings Volume 1209, Picosecond and Femtosecond Spectroscopy from Laboratory to Real World; (1990) https://doi.org/10.1117/12.17895
Event: OE/LASE '90, 1990, Los Angeles, CA, United States

Abstract

Fluorescence decay profiles are used to monitor carrier dynamics at the interface between single crystalline CdSe electrodes and 0.5M KOH solution. The fluorescence decay profiles are found to be independent of temperature over the range from 277K to 337K. It is also shown that a diffusion model of the carrier dynamics with a single rate constant for surface recombination does not adequately describe the observed dynamics.

Citation Download Citation

M. L. Shumaker, D. Burdelski, and David H. Waldeck "Time-resolved fluorescence studies of surface recombination in CdSe electrodes", Proc. SPIE 1209, Picosecond and Femtosecond Spectroscopy from Laboratory to Real World, (1 April 1990); https://doi.org/10.1117/12.17895

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