Determination of the orientational order parameters in polysilane LB-films by measuring third-order-susceptibility tensor components

Myoungsik Cha; Dieter Neher; F. W. Embs; Silvia Mittler-Neher; George I. Stegeman

doi:10.1117/12.148436

23 July 1993 Determination of the orientational order parameters in polysilane LB-films by measuring third-order-susceptibility tensor components

Myoungsik Cha, Dieter Neher, F. W. Embs, Silvia Mittler-Neher, George I. Stegeman

Author Affiliations +

Proceedings Volume 1852, Nonlinear Optical Properties of Advanced Materials; (1993) https://doi.org/10.1117/12.148436
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States

Abstract

We demonstrate a new method for investigating the orientational distribution of the rod-like poly[bis(m-butoxyphenyl) silane] molecules in Langmuir-Blodgett (LB) films. The first two non-trivial in-plane orientational order parameters C₂ and C₄ could be easily deduced by measuring the independent tensor components of (chi) ⁽³)(-(omega) ₃;(omega) ₁,(omega) ₁,(omega) ₂). Using this method, we show that the annealing process improves the molecular alignment along the dipping direction. We were also able to get information about the domain morphology of the film from the off-diagonal components of (chi) ⁽³).

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Myoungsik Cha, Dieter Neher, F. W. Embs, Silvia Mittler-Neher, and George I. Stegeman "Determination of the orientational order parameters in polysilane LB-films by measuring third-order-susceptibility tensor components", Proc. SPIE 1852, Nonlinear Optical Properties of Advanced Materials, (23 July 1993); https://doi.org/10.1117/12.148436

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