Fullerene tips for scanning probe microscopy

Kevin F. Kelly; Dipankar Sarkar; Stephen J. Oldenburg; Gregory D. Hale; Naomi J. Halas

doi:10.1117/12.262973

16 December 1996 Fullerene tips for scanning probe microscopy

Kevin F. Kelly, Dipankar Sarkar, Stephen J. Oldenburg, Gregory D. Hale, Naomi J. Halas

Proceedings Volume 2854, Fullerenes and Photonics III; (1996) https://doi.org/10.1117/12.262973
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

We have succeeded in adsorbing individual C60 molecules onto the tunneling region of an STM tip. The individual tip- adsorbed molecules are imaged by scanning the fullerene- adsorbed tip over a defect covered graphite surface. The nanometer-size defects serve as a surface tip array which 'inverse images' the molecules adsorbed to the tip when the surface is scanned. These tips were subsequently used to observe threefold symmetric electron scattering from point defects on a graphite surface, an effect that could not be observed using bare metal tips. Functionalizing an STM tip with an appropriate molecule adsorbate alters the density of states near the Fermi level of the tip and changes its imaging characteristics.

Citation Download Citation

Kevin F. Kelly, Dipankar Sarkar, Stephen J. Oldenburg, Gregory D. Hale, and Naomi J. Halas "Fullerene tips for scanning probe microscopy", Proc. SPIE 2854, Fullerenes and Photonics III, (16 December 1996); https://doi.org/10.1117/12.262973

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