Paper
29 November 2000 Behavior of current under dc field and switching, and current-controlled negative resistance and oscillation on MOM device of Bi2O3 film
Kazunori Komorita
Author Affiliations +
Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408467
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China
Abstract
By using the MOM device of Bi2O3 films, some electrical properties on these films or the device are studied as follows: (1) The behavior of the electric current across the thick Bi2O3 films under DC field, is elucidated by the formula Ivaries direct asVn for the regions of low (n equals 1), ohmic (n equals 1), high (n > 2) conductivities and SCLC (n >= 1.5 approximately 2). A hysteresis of the I-V curve results from the residual space charge and polarization in the device. (2) The memory switching and oscillation (in CCNR) phenomena on the device of thin Bi2O3 films are observed under the AC applied voltage in the room temperature and 77 K. These rest upon a thermal effect due to the current injection to the device.
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Kazunori Komorita "Behavior of current under dc field and switching, and current-controlled negative resistance and oscillation on MOM device of Bi2O3 film", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); https://doi.org/10.1117/12.408467
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KEYWORDS
Switching

Thin films

Thin film devices

Silver

Thermal effects

Resistance

Bismuth

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