Paper
14 February 2005 Optical path difference in a plane parallel uniaxial plate
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Proceedings Volume 5776, Eighth International Symposium on Laser Metrology; (2005) https://doi.org/10.1117/12.611648
Event: Eighth International Conference on Laser Metrology, 2005, Merida, Mexico
Abstract
The generalized ray tracing for the extraordinary ray through uniaxial crystals developed by M. Avendanyo-Alejo and O. Stavroudis, is applied to investigate the optical path difference between the ordinary and the extraordinary rays in a plane parallel uniaxial plate. When a ray of light from a monochromatic source S is incident on the surface of a plane parallel uniaxial plate, two rays: an ordinary ray and an extraordinary ray will propagate inside the plate until they are refracted at the second interface of the plate. These two rays are orthogonally polarized so they do not interfere unless a polarizer is placed after the plate to make the parallel components of their respective electric fields interfere. In the present work we analyze the optical path difference traversed by the ordinary ray and the extraordinary ray.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maximino M. Avendanyo-Alejo and Martha Rosete-Aguilar "Optical path difference in a plane parallel uniaxial plate", Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); https://doi.org/10.1117/12.611648
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Cited by 3 scholarly publications.
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KEYWORDS
Crystals

Geometrical optics

Ray tracing

Refractive index

Interfaces

Refraction

Wavefronts

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