Paper
10 March 1988 Coupling And Absorption Phenomena In Semiconductor-Clad Dielectric Optical Waveguides
Richard F. Carson, Ted E. Batchman
Author Affiliations +
Proceedings Volume 0835, Integrated Optical Circuit Engineering V; (1988) https://doi.org/10.1117/12.942309
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States
Abstract
Unique propagation characteristics arise from the coupling of light between the lossless modes of a dielectric waveguide and the lossy modes supported by an absorptive cladding layer such as a semiconductor. These effects occur because the propagating lightwave couples into a variety of modes that exist in the semiconductor-clad waveguide. Properties such as cladding thickness, refractive index, and absorption level greatly affect modes of the clad waveguide. Such mode effects are due to periodic coupling between the dielectric layer and the semiconductor cladding. The resulting characteristics suggest use in various device applications. Here, we characterize the periodic coupling effect and how it creates unique modes in the clad waveguide structure. We also describe how the refractive index and absorption of the cladding work together to influence the properties of those modes.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard F. Carson and Ted E. Batchman "Coupling And Absorption Phenomena In Semiconductor-Clad Dielectric Optical Waveguides", Proc. SPIE 0835, Integrated Optical Circuit Engineering V, (10 March 1988); https://doi.org/10.1117/12.942309
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Cited by 2 scholarly publications.
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KEYWORDS
Waveguides

Cladding

Silicon

Absorption

Semiconductors

Dielectrics

Signal attenuation

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