Photovoltaic reliability engineering: quantification testing and probabilistic-design-reliability concept

Ephraim Suhir; Laurent Bechou; Alain Bensoussan; Johann Nicolics

doi:10.1117/12.2030377

24 September 2013 Photovoltaic reliability engineering: quantification testing and probabilistic-design-reliability concept

Ephraim Suhir, Laurent Bechou, Alain Bensoussan, Johann Nicolics

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Proceedings Volume 8825, Reliability of Photovoltaic Cells, Modules, Components, and Systems VI; 88250K (2013) https://doi.org/10.1117/12.2030377
Event: SPIE Solar Energy + Technology, 2013, San Diego, California, United States

Abstract

Qualification testing (QT) is the major means for making a viable photovoltaic (PV) device into a reliable and marketable product. It is well known, however, that the today’s PV modules (PVM) that passed the existing QT often exhibit premature field failures. Could the existing QT specifications and testing procedures be improved to an extent that if a PV device, module or a system passed the QT, there is a quantifiable and consistent way to assure that its performance in the field will be satisfactory and that its projected lifetime will indeed take place with the given confidence? The application of the probabilistic design for reliability (PDfR) concept enables one to provide an affirmative answer to this question. The attributes and challenges of this concept and the roles of its major constituents - failure oriented accelerated testing (FOAT) and physically meaningful predictive modeling (PM) - are addressed and discussed in detail.

Citation Download Citation

Ephraim Suhir, Laurent Bechou, Alain Bensoussan, and Johann Nicolics "Photovoltaic reliability engineering: quantification testing and probabilistic-design-reliability concept", Proc. SPIE 8825, Reliability of Photovoltaic Cells, Modules, Components, and Systems VI, 88250K (24 September 2013); https://doi.org/10.1117/12.2030377

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KEYWORDS

Reliability

Photovoltaics

Manufacturing

Phase modulation

Solar cells

Humidity

Physics

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