High reliability of high power and high brightness diode lasers

M. Kanskar; L. Bao; J. Bai; Z. Chen; D. Dahlen; M. DeVito; W. Dong; M. Grimshaw; J. Haden; X. Guan; M. Hemenway; K. Kennedy; R. Martinsen; J. Tibbals; W. Urbanek; S. Zhang

doi:10.1117/12.2040851

7 March 2014 High reliability of high power and high brightness diode lasers

M. Kanskar, L. Bao, J. Bai, Z. Chen, D. Dahlen, M. DeVito, W. Dong, M. Grimshaw, J. Haden, X. Guan, M. Hemenway, K. Kennedy, R. Martinsen, J. Tibbals, W. Urbanek, S. Zhang

Author Affiliations +

Proceedings Volume 8965, High-Power Diode Laser Technology and Applications XII; 896508 (2014) https://doi.org/10.1117/12.2040851
Event: SPIE LASE, 2014, San Francisco, California, United States

Abstract

We report on continued progress in the development of high power and high brightness single emitter laser diodes from 790 nm to 980 nm for reliable use in industrial and pumping applications. High performance has been demonstrated in nLIGHT’s diode laser technology in this spectral range with corresponding peak electrical-to-optical power conversion efficiency of ~65%. These pumps have been incorporated into nLIGHT’s fiber-coupled pump module, elementTM. We report the latest updates on performance and reliability of chips and fiber-coupled modules. This paper also includes a new chip design with significantly narrower slow-axis divergence which enables further improved reliable power and brightness. Preliminary reliability assessment data for these devices will be presented here as well.

Citation Download Citation

M. Kanskar, L. Bao, J. Bai, Z. Chen, D. Dahlen, M. DeVito, W. Dong, M. Grimshaw, J. Haden, X. Guan, M. Hemenway, K. Kennedy, R. Martinsen, J. Tibbals, W. Urbanek, and S. Zhang "High reliability of high power and high brightness diode lasers", Proc. SPIE 8965, High-Power Diode Laser Technology and Applications XII, 896508 (7 March 2014); https://doi.org/10.1117/12.2040851

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available