Junction box wiring and connector durability issues in photovoltaic modules

Juris Kalejs

doi:10.1117/12.2063488

8 October 2014 Junction box wiring and connector durability issues in photovoltaic modules

Juris Kalejs

Proceedings Volume 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII; 91790S (2014) https://doi.org/10.1117/12.2063488
Event: SPIE Solar Energy + Technology, 2014, San Diego, California, United States

Abstract

We report here on Photovoltaic (PV) module durability issues associated with junction boxes which are under study in Task 10 of the International PV Quality Assurance Task Force (PVQAT). A number of failure modes are being identified in junction boxes in PV arrays in the field which have less than 5 years outdoor operation. Observed failure modes include melted contacts and plastic walls in the junction boxes, separated external connectors and broken latches. Standard IEC and UL tests for modules are designed to expose early mortality failures due to materials selection and design in the assembled module and their impact on performance and safety. Test standards for individual junction box components, when not part of a PV module, are still in development. We will give an overview of the reported field failures associated with junction boxes, and examine standard development as it may impact on testing for durability of junction box connectors over a 25 year life.

Citation Download Citation

Juris Kalejs "Junction box wiring and connector durability issues in photovoltaic modules", Proc. SPIE 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, 91790S (8 October 2014); https://doi.org/10.1117/12.2063488

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