Dr. Giancarlo Pedrini
Coherent Measurement Group Leader at Institut für Technische Optik
SPIE Involvement:
Conference Program Committee | Author
Publications (87)

Proceedings Article | 15 August 2023 Presentation + Paper
Proceedings Volume 12618, 126181D (2023) https://doi.org/10.1117/12.2675717
KEYWORDS: Holography, Photons, Digital holography, Stray light, Signal to noise ratio, Optical coherence, Visibility through fog, Visibility

Proceedings Article | 17 March 2023 Poster
Alexander Gröger, Giancarlo Pedrini, Daniel Claus, Felix Fischer, Stephan Reichelt, Simon Thiele, Nils Fahrbach
Proceedings Volume PC12356, PC123560P (2023) https://doi.org/10.1117/12.2662817
KEYWORDS: 3D metrology, Holography, Endoscopes, Wavefronts, Wavefront distortions, Micro optics, Holograms, Digital holography, Cameras

Proceedings Article | 20 May 2022 Presentation + Paper
G. Pedrini, A. Schiebelbein, E. Achimova, V. Abashkin
Proceedings Volume 12136, 1213605 (2022) https://doi.org/10.1117/12.2620778
KEYWORDS: Diffraction, Phase imaging, Microscopy, Digital holography, Wave propagation, Phase retrieval, Spatial resolution

Proceedings Article | 20 June 2021 Presentation + Paper
Proceedings Volume 11782, 1178214 (2021) https://doi.org/10.1117/12.2592727
KEYWORDS: Point spread functions, Image retrieval, Scattering, Scanning probe microscopy, Microscopy, Light scattering, Scattering media, Optical storage, Mirrors, Microscopes

Proceedings Article | 20 June 2021 Presentation + Paper
Proceedings Volume 11786, 117860K (2021) https://doi.org/10.1117/12.2592613
KEYWORDS: Digital holography, Microscopy, Holography, Mirrors, Holograms, Glasses, Cameras, Spatial resolution, Spatial filters, Resolution enhancement technologies

Showing 5 of 87 publications
Conference Committee Involvement (17)
Holography: Advances and Modern Trends IX
7 April 2025 | Prague, Czech Republic
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Unconventional Optical Imaging IV
8 April 2024 | Strasbourg, France
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Holography: Advances and Modern Trends VIII
24 April 2023 | Prague, Czech Republic
Showing 5 of 17 Conference Committees
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