Yuanyuan Hou
at Zhejiang Normal Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 March 2017 Paper
Yuanyuan Hou, Jiancheng Xu
Proceedings Volume 10255, 1025506 (2017) https://doi.org/10.1117/12.2267390
KEYWORDS: Shearography, Fringe analysis, Speckle pattern, Phase shifts, Principal component analysis, Phase shift keying, Speckle, Phase measurement, Algorithm development, Cameras

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