Quantitative phase microscopy for metrology in nanophotonics

Guillaume Baffou

doi:10.1117/12.2652113

17 March 2023 Quantitative phase microscopy for metrology in nanophotonics

Guillaume Baffou

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Proceedings Volume PC12410, Nanoscale and Quantum Materials: From Synthesis and Laser Processing to Applications 2023; PC124100G (2023) https://doi.org/10.1117/12.2652113
Event: SPIE LASE, 2023, San Francisco, California, United States

Abstract

In this presentation, I show how we have been using a particularly sensitive and simple quantitative phase microscopy technique(QPM) technique called cross-grating phase microscopy (CGM) for applications in nanophotonics, opening a new route of investigation for QPM, besides biology. This contribution is aimed to explain (i) how CGM can be used as a temperature microscopy technique to map the temperature of gold nanoparticles under illumination, enabling applications in physics, chemistry and biology at the nano/microscale; (ii) how CGM can map the complex optical conductivity and complex refractive index of 2D materials; (iii) how CGM can retrieve the complex optical polarizability of nanoparticles, along with the extinction, scattering and absorption cross sections from a single interferogram image, and finally (iv) how CGM can fully characterize metasurfaces.

Conference Presentation

Citation Download Citation

Guillaume Baffou "Quantitative phase microscopy for metrology in nanophotonics", Proc. SPIE PC12410, Nanoscale and Quantum Materials: From Synthesis and Laser Processing to Applications 2023, PC124100G (17 March 2023); https://doi.org/10.1117/12.2652113

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KEYWORDS

Microscopy

Nanoparticles

Nanophotonics

Metrology

Biomedical optics

Chemistry

Interferometry

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