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In this work, we perform spectroscopic ellipsometry measurements at room temperature on mechanically exfoliated α-RuCl3 nanoflakes of different thickness for photon wavelengths ranging between 400 and 1000 nm. Our measurements allow us to estimate the wavelength-dependent complex refractive index along the crystal directions parallel and perpendicular to the layers, which reveal an anisotropy between the in-plane and out-of-plane optical properties of the material. Our results provide a valuable information about the optical properties of 2D α-RuCl3 flakes in the visible and near infrared, which are crucial to exploit this material in nanodevices with enhanced light-matter interactions.
Tatyana V. Ivanova,Daniel Andres-Penares,Yiping Wang,Jiaqiang Yan,Kenneth S. Burch,Brian D. Gerardot, andMauro Brotons-Gisbert
"Optical contrast analysis of α-RuCl3 nanoflakes on oxidized silicon wafers", Proc. SPIE PC12651, Low-Dimensional Materials and Devices 2023, PC126510R (5 October 2023); https://doi.org/10.1117/12.2675491
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Tatyana V. Ivanova, Daniel Andres-Penares, Yiping Wang, Jiaqiang Yan, Kenneth S. Burch, Brian D. Gerardot, Mauro Brotons-Gisbert, "Optical contrast analysis of α-RuCl3 nanoflakes on oxidized silicon wafers," Proc. SPIE PC12651, Low-Dimensional Materials and Devices 2023, PC126510R (5 October 2023); https://doi.org/10.1117/12.2675491