Enhancement Of X-Ray Performance With New GEC Charged Coupled Devices (CCD)

D. A. Schwartz; F. K. Knight; D. Lumb; E. Chowanietz; A. Wells

doi:10.1117/12.950316

11 December 1985 Enhancement Of X-Ray Performance With New GEC Charged Coupled Devices (CCD)

D. A. Schwartz, F. K. Knight, D. Lumb, E. Chowanietz, A. Wells

Proceedings Volume 0570, Solid-State Imaging Arrays; (1985) https://doi.org/10.1117/12.950316
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

We have tested samples of two GEC charge coupled devices with enhanced x-ray performance. The P8607, fabricated with reduced linear dimensions, gives the lowest detector noise reported for Fe-55 with a CCD. The deep depletion device P8600-HR gives the best combination of energy resolution and quantum efficiency at 6 keV. We discuss the energy resolution vs quantum efficiency trade-off curve.

Citation Download Citation

D. A. Schwartz, F. K. Knight, D. Lumb, E. Chowanietz, and A. Wells "Enhancement Of X-Ray Performance With New GEC Charged Coupled Devices (CCD)", Proc. SPIE 0570, Solid-State Imaging Arrays, (11 December 1985); https://doi.org/10.1117/12.950316

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