Characterization of 820-nm Single Mode Fibers

R. L. Flurer; A. J. Cordi; C. W. Colburn; B. M. Whitcomb; J. W. Ogle

doi:10.1117/12.937632

4 February 1987 Characterization of 820-nm Single Mode Fibers

R. L. Flurer, A. J. Cordi, C. W. Colburn, B. M. Whitcomb, J. W. Ogle

Proceedings Volume 0721, Fiber Optics in Adverse Environments III; (1987) https://doi.org/10.1117/12.937632
Event: Cambridge Symposium-Fiber/LASE '86, 1986, Cambridge, MA, United States

Abstract

Increasing interest in the use of high bandwidth optical diagnostic measurement systems at the Nevada Test Site (NTS) has prompted the use of single mode fiber (SMF). In an ef-fort to improve the time response of experimental systems designed for use in the 800- to 900-nm spectrum, SMF optimized for 850-nm operation has been obtained. Experimental systems to characterize this fiber have been developed. Measurements to determine the fibers' bandwidth, material dispersion, mode field diameter (MFD), cut-off wavelength, numerical aperture (NA), and spectral attenuation have been completed. These experimental data are presented in the text.

Citation Download Citation

R. L. Flurer, A. J. Cordi, C. W. Colburn, B. M. Whitcomb, and J. W. Ogle "Characterization of 820-nm Single Mode Fibers", Proc. SPIE 0721, Fiber Optics in Adverse Environments III, (4 February 1987); https://doi.org/10.1117/12.937632

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available