Enhancement And Quantification Of Features In Electron Microscope Images

Ricardo Peralta-Fabi; Esau Vicente-Vivas

doi:10.1117/12.942126

18 January 1988 Enhancement And Quantification Of Features In Electron Microscope Images

Ricardo Peralta-Fabi, Esau Vicente-Vivas

Proceedings Volume 0829, Applications of Digital Image Processing X; (1988) https://doi.org/10.1117/12.942126
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

Several algorithms and devices have been developed to enhance and restore detils, as well as to quantify features in microscopic images, that have been obtained with a scanning electron microscope (SEM) from samples submitted to stress fields within the SEM. A microcomputer is used to control the scanning of the electron beam and to acquire and digitize images for processing. By the use of both, software and hardware manipulation it is possible to observe and quantify microdisplacements of the elements of a composite material, in order to advance the understanding of their behaviour in the elastic and plastic regimes, as well as to characterize their fracture modes.

Citation Download Citation

Ricardo Peralta-Fabi and Esau Vicente-Vivas "Enhancement And Quantification Of Features In Electron Microscope Images", Proc. SPIE 0829, Applications of Digital Image Processing X, (18 January 1988); https://doi.org/10.1117/12.942126

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