Application Of Moire Interferometry To A Contact Problem

Jing Fang

doi:10.1117/12.948031

27 January 1989 Application Of Moire Interferometry To A Contact Problem

Jing Fang

Proceedings Volume 0965, Current Developments in Optical Engineering III; (1989) https://doi.org/10.1117/12.948031
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

The moire interferometry of high sensitivity is used in the solution of the load distribution on the boundary of semi-infinite plane. The displacement components normal to the edge or their partial derivatives with respect to the boundary coordinate are obtained from experimental data and then applied respectively to linear equations to solve the contact stresses.

Citation Download Citation

Jing Fang "Application Of Moire Interferometry To A Contact Problem", Proc. SPIE 0965, Current Developments in Optical Engineering III, (27 January 1989); https://doi.org/10.1117/12.948031

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