Paper
5 July 1989 Sprite Detectors And Staring Arrays In Hg1-xCdxTe
C T Elliott
Author Affiliations +
Proceedings Volume 1038, 6th Mtg in Israel on Optical Engineering; (1989) https://doi.org/10.1117/12.951026
Event: Sixth Meeting of Optical Engineering in Israel, 1988, Tel Aviv, Israel
Abstract
The evolution of the Sprite detector from its invention in 1974 to the present is reviewed. The use of anamorphic optics to reduce the effects of carrier diffusion, together with changes to the device shape has produced very high spatial resolution. Improved material and two-dimensional structures have further increased the thermal sensitivity. A brief description of the technology for two-dimensional, electronicaly addressed diode arrays is also given, together with a discussion of the mechanism of p to n type conversion.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C T Elliott "Sprite Detectors And Staring Arrays In Hg1-xCdxTe", Proc. SPIE 1038, 6th Mtg in Israel on Optical Engineering, (5 July 1989); https://doi.org/10.1117/12.951026
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Cited by 6 scholarly publications.
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KEYWORDS
Sensors

Diffusion

Spatial resolution

Staring arrays

Thermography

Diodes

Silicon

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