Open Access Paper
12 June 2018 Front Matter: Volume 10556
Proceedings Volume 10556, Advances in Display Technologies VIII; 1055601 (2018) https://doi.org/10.1117/12.2322864
Event: SPIE OPTO, 2018, San Francisco, California, United States
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10556, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Advances in Display Technologies VIII, edited by Liang-Chy Chien, Tae-Hoon Yoon, Qiong-Hua Wang, Proceedings of SPIE Vol.10556 (SPIE, Bellingham, WA, 2018) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510615977

ISBN: 9781510615984 (electronic)

Published by SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445

SPIE.org

Copyright © 2018, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/18/$18.00.

Printed in the United States of America.

Publication of record for individual papers is online in the SPIE Digital Library.

00001_PSISDG10556_1055601_page_2_1.jpg

Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Abdollahi, H., 0A

Adrian, Julien, 0B

Aventurier, Bernard, 0I

Azuma, Y., 0H

Berger, Frédéric, 0I

Blanc, Pierre, 0C

Boher, Pierre, 0C

Cao, Liangcai, 0O

Chen, J., 0H

Chen, Liang, 0K

Chen, Yu, 0K

Choi, Geunseop, 04, 05

Choi, Tae-Hoon, 07

Choi, Yeongyu, 07

Daami, Anis, 0I

Dupont, Bertrand, 0I

Dupré, Ludovic, 0I

Gallagher, Dennis G., 03

Hahn, Joonku, 04, 05

He, Zehao, 0O

Henry, Franck, 0I

Heo, Daerak, 04

Holzman, J. F., 0A

Hue, David, 0B

Hughes, William W., 03

Jeon, Byoung-Gyu, 07

Jeon, Hosung, 05

Jiao, Cheng, 0K

Jin, Guofan, 0O

Jin, X., 0A

Kim, Dongyeon, 06

Kim, Hwi, 05

Konda, Tadayuki, 0L

Kume, Y., 0H

Le Brun, Johan, 0B

Lee, Byoungho, 06

Lee, Ji-Hoon, 09

Lee, Seungjae, 06

Leroux, Thierry, 0C

Li, Jianli, 0K

Lim, Sungjin, 04

Manley, Richard J., 03

Mathieu, Lydie, 0I

Moon, Seokil, 06

Moriyama, T., 0H

Nakadate, S., 0H

Olivier, François, 0I

Park, H. S., 0A

Pilcher, Allie M., 03

Porte, Sophie, 0B

Renet, Sébastien, 0I

Sarrasin, Denis, 0I

Shibuya, M., 0H

Song, Wen, 0K

Stoeber, B., 0A

Su, Ping, 0O

Takahashi, Hideya, 0L

Tanaka, Katsuhisa, 0L

Templier, François, 0I

Walecki, Wojtek J., 0E

Wang, Guanjun, 0K

Wang, Kaian, 0K

Wang, Qiong-Hua, 0D

Wang, Shigang, 0M

Wang, Zhenhao, 0M

Woo, Jae-Hyeon, 07

Xing, Yan, 0D

Xiong, Zhao-Long, 0D

Yan, W., 0A

Yang, Jidong, 0K

Yoon, Tae-Hoon, 07

Yoshimoto, Kayo, 0L

Zhang, Dao, 0K

Zhang, Hao, 0O

Zhang, Yu Ping, 0K

Zhao, Min, 0D

Zhao, Yan, 0M

Conference Committee

Symposium Chairs

  • Connie J. Chang-Hasnain, University of California, Berkeley (United States)

  • Graham T. Reed, Optoelectronics Research Centre, University of Southampton (United Kingdom)

Symposium Co-chairs

  • Jean Emmanuel Broquin, IMEP-LAHC (France)

  • Shibin Jiang, AdValue Photonics, Inc. (United States)

Program Track Chair

  • Liang-Chy Chien, Kent State University (United States)

Conference Chairs

  • Liang-Chy Chien, Kent State University (United States)

  • Tae-Hoon Yoon, Pusan National University (Korea, Republic of)

  • Qiong-Hua Wang, Sichuan University (China)

Conference Program Committee

  • Karlheinz Blankenbach, Pforzheim Universität (Germany)

  • Pierre M. Boher, ELDIM (France)

  • Liangcai Cao, Tsinghua University (China)

  • Cheng-Huan Chen, National Tsing Hua University (Taiwan)

  • Janglin Chen, Industrial Technology Research Institute (Taiwan)

  • Jurgen H. Daniel, PARC, A Xerox Company (United States)

  • Paul S. Drzaic, Apple Inc. (United States)

  • Mark Fihn, Apple Inc. (United States)

  • Norbert Fruehauf, Universität Stuttgart (Germany)

  • Nobuyuki Hashimoto, Citizen Holdings Company, Ltd. (Japan)

  • Klaus Hecker, VDMA (Germany)

  • Alex Henzen, IRX-Innovations B.V. (Netherlands)

  • Yi-Pai Huang, National Chiao Tung University (Taiwan)

  • Lachezar Komitov, University of Gothenburg (Sweden)

  • Byoungho Lee, Seoul National University (Korea, Republic of)

  • Jiun-Haw Lee, National Taiwan University (Taiwan)

  • Sin-Doo Lee, Seoul National University (Korea, Republic of)

  • Kars-Michiel H. Lenssen, Philips Research Nederland B.V. (Netherlands)

  • Akihiro Mochizuki, i-CORE Technology, LLC (United States)

  • Keith Rollins, DuPont Teijin Films U.K. Ltd. (United Kingdom)

  • Robert A. Sprague, Amazon Lab126 (United States)

  • Andrew J. Steckl, University of Cincinnati (United States)

  • Michael Wittek, Merck KGaA (Germany)

Session Chairs

  • 1 3D, Light-Field, and AR/VR Displays

    Qiong-Hua Wang, Sichuan University (China)

  • 2 Display Materials and Systems

    Akihiro Mochizuki, i-CORE Technology, LLC (United States)

  • 3 Display Manufacturing and Metrology

    Tae-Hoon Yoon, Pusan National University (Korea, Republic of)

  • 4 Emissive Displays

    Jiun-Haw Lee, National Taiwan University (Taiwan)

© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10556", Proc. SPIE 10556, Advances in Display Technologies VIII, 1055601 (12 June 2018); https://doi.org/10.1117/12.2322864
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
LCDs

3D displays

Algorithm development

Current controlled current source

Imaging systems

Metrology

3D image processing

Back to Top