Coherent Raman scattering at interfaces (Conference Presentation)

Eric O. Potma; John Kenison

doi:10.1117/12.2322636

17 September 2018 Coherent Raman scattering at interfaces (Conference Presentation)

Eric O. Potma, John Kenison

Proceedings Volume 10753, Ultrafast Nonlinear Imaging and Spectroscopy VI; 1075305 (2018) https://doi.org/10.1117/12.2322636
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States

Abstract

Coherent Raman scattering (CRS) is a popular technique for ultrafast spectroscopy and microscopy studies. CRS is based on a third-order nonlinear light-matter interaction, characterized by a nonlinear susceptibility with nonzero elements for bulk samples. It is challenging to perform CRS measurements at interfaces, as bulk contributions can often overwhelm. We have developed a surface-sensitive approach for CRS spectroscopy and microscopy, which enhances the sensitivity to interfacial processes by at least tenfold.

Conference Presentation

Citation Download Citation

Eric O. Potma and John Kenison "Coherent Raman scattering at interfaces (Conference Presentation)", Proc. SPIE 10753, Ultrafast Nonlinear Imaging and Spectroscopy VI, 1075305 (17 September 2018); https://doi.org/10.1117/12.2322636

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