Paper
1 October 2018 Correlating software metrics with software defects
Maciej Korpalski, Janusz Sosnowski
Author Affiliations +
Proceedings Volume 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018; 108081P (2018) https://doi.org/10.1117/12.2501150
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 2018, Wilga, Poland
Abstract
In software development and testing an interesting issue is checking correlations of observed software defects with various product and process metrics. Such analysis is helpful in predicting potential defects and optimization of testing processes. In the paper we present results of deeper studies in this area, they involve many metrics and various prediction schemes taking into account diverse correlation parameters. Special attention is paid to the problem of selecting most significant metrics. In the prediction schemes we consider modified and non modified program objects. The presented analysis methods have been verified in an experimental investigation covering twelve open source projects, for some of them several subsequent versions have been examined. This is followed by result discussion.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maciej Korpalski and Janusz Sosnowski "Correlating software metrics with software defects", Proc. SPIE 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 108081P (1 October 2018); https://doi.org/10.1117/12.2501150
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Cited by 1 scholarly publication.
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KEYWORDS
Data modeling

Lab on a chip

Content addressable memory

Correlation function

Java

Reliability

Copper

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