Readout Producibility For Z-Technology

Robert C. Kline; Noel D. Jolivet; Omkarnath K. Gupta

doi:10.1117/12.960389

13 September 1989 Readout Producibility For Z-Technology

Robert C. Kline, Noel D. Jolivet, Omkarnath K. Gupta

Proceedings Volume 1097, Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array; (1989) https://doi.org/10.1117/12.960389
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

Production rates of low-noise, cryogenic readout devices have been demonstrated. These devices are being produced under a MIL-Q-9858A quality system and are processed per the requirements of MIL-STD-883C. Performance, testability, reliability and producibility of the design have been equally considered throughout the development cycle. All required processes, test methodologies, and quality assurance procedures have been implemented to support production requirements.

Citation Download Citation

Robert C. Kline, Noel D. Jolivet, and Omkarnath K. Gupta "Readout Producibility For Z-Technology", Proc. SPIE 1097, Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array, (13 September 1989); https://doi.org/10.1117/12.960389

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