Paper
21 June 2019 Digital holographic microscopy for thickness characterization using synthetized partially coherent holograms
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Abstract
In this work we propose a holographic approach for accurate characterization of thickness of transparent objects. The proposed method is based on recording a series of fully-coherent holograms, which are generated with varying tilt of object plane wave illumination. The captured holograms are numerically processed to obtain the corresponding complex fields, which are used to produce the longitudinal coherence function. This function allows to measure the absolute thickness of transparent parallel plates using highly monochromatic light source. The conclusions of this work are supported with results of numerical simulations.
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Marta Mikuła, Juan Martinez-Carranza, and Tomasz Kozacki "Digital holographic microscopy for thickness characterization using synthetized partially coherent holograms", Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110563P (21 June 2019); https://doi.org/10.1117/12.2525691
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KEYWORDS
Holograms

Digital holography

Holography

Beam splitters

Spatial light modulators

Light sources

Microscopy

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