Presentation + Paper
9 September 2019 Differential deposition for figure correction of x-ray mirrors
Ch. Morawe, S. Labouré, J-Ch. Peffen, F. Perrin, A. Vivo, R. Barrett
Author Affiliations +
Abstract
Differential deposition techniques were applied to reduce the figure error of x-ray mirrors. Cr layers were sputtered on flat substrates that were moved with variable speed in front of a beam defining aperture. The required velocity profile was calculated using a deconvolution algorithm. The Cr thickness profiles were derived in two ways: directly, using x-ray reflectivity and indirectly, by measuring the surface figure before and after the deposition. After two iterations the mirror surface figure could be improved by almost one order of magnitude. This work will describe the experimental techniques and discuss the achieved accuracy. It will also address open questions such as layer stress, roughness evolution, and limitations of the available instrumentation.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ch. Morawe, S. Labouré, J-Ch. Peffen, F. Perrin, A. Vivo, and R. Barrett "Differential deposition for figure correction of x-ray mirrors", Proc. SPIE 11108, Advances in X-Ray/EUV Optics and Components XIV, 1110807 (9 September 2019); https://doi.org/10.1117/12.2528750
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Chromium

Mirrors

X-rays

Surface roughness

Reflectivity

Interferometers

Metrology

RELATED CONTENT

Commissioning of the Montel nano optics for the x ray...
Proceedings of SPIE (January 01 1900)
Mirror figure correction on variable length scales
Proceedings of SPIE (September 21 2021)
Advanced multilayer Laue lens fabrication at NSLS-II
Proceedings of SPIE (October 19 2012)
Future metrology needs for FEL reflective optics
Proceedings of SPIE (January 25 2001)
Performance of silicon pore optics
Proceedings of SPIE (July 15 2008)

Back to Top