Fully automated detector testbench

M. Bonati; J. Estrada; A. Castaneda; P. Hernandez

doi:10.1117/12.2559203

13 December 2020 Fully automated detector testbench

M. Bonati, J. Estrada, A. Castaneda, P. Hernandez

Proceedings Volume 11452, Software and Cyberinfrastructure for Astronomy VI; 114521L (2020) https://doi.org/10.1117/12.2559203
Event: SPIE Astronomical Telescopes + Instrumentation, 2020, Online Only

Conference Poster

Abstract

We present a fully-automated CCD testbench. The system performs all the tests in about 12 hours, and when done reduces the data, grading the device and presenting the results in the form of both a pdf report and web-based tables . All the data goes automatically to a database where both the raw and processed data can be visualized and compared with other devices, allowing for detector statistical graphs (number of devices over certain threshold in any given parameter, etc). The testbench was developed in the context of a FermiLab and CTIO collaboration for the packaging and characterization of the red and NIR science ccds for the Dark Energy Spectroscopic Instrument (DESI), where over 40 devices were tested. The system was further expanded at CTIO to be used with any ccd or detector controller. The characterization includes non-linearity (high and low), full well, flats and darks cosmetics (hot and dark pixels, bad columns,etc), dark current, noise, CTE, absolute QE and lateral diffusion.

Conference Presentation

Citation Download Citation

M. Bonati, J. Estrada, A. Castaneda, and P. Hernandez "Fully automated detector testbench", Proc. SPIE 11452, Software and Cyberinfrastructure for Astronomy VI, 114521L (13 December 2020); https://doi.org/10.1117/12.2559203

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