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10 October 2020 Self-calibrated frequency response measurement of optoelectronic devices based on spectral mapping
Shangjian Zhang, Zhiyao Zhang, Yong Liu
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Proceedings Volume 11555, Real-time Photonic Measurements, Data Management, and Processing V; 1155502 (2020) https://doi.org/10.1117/12.2573337
Event: SPIE/COS Photonics Asia, 2020, Online Only
Abstract
We demonstrate in this talk a self-calibrated extraction of microwave characteristic parameters of optoelectronic devices including modulators and photodiodes with self-reference capability based on heterodyne spectral mapping. The method saves half bandwidth or extends twice measuring frequency range, since the frequency response of DUT at f is determined from the electrical components at about f/2 (modulator cases), or with two driving signals at about f/2 (photodetector case). Furthermore, we extended the spectral mapping method to segmental up-conversion for ultra-wide and scalable measurement of PDs with 2M-fold measuring frequency range (M>10). In contrast to the VNA swept frequency method, ours realizes the frequency response measurement with self-reference capability, promising for fully integrated wafer-level devices or circuits.
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Shangjian Zhang, Zhiyao Zhang, and Yong Liu "Self-calibrated frequency response measurement of optoelectronic devices based on spectral mapping", Proc. SPIE 11555, Real-time Photonic Measurements, Data Management, and Processing V, 1155502 (10 October 2020); https://doi.org/10.1117/12.2573337
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KEYWORDS
Calibration
Optoelectronic devices
Measurement devices
Transducers
Electro optics
Modulators
Palladium
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