Brilliant light for materials science: industrial applications of synchrotron radiation-based microtomography at the tomography instruments by GEMS at PETRA III

Marc Thiry; Felix Beckmann; Jörg U. Hammel; Julian P. Moosmann; Fabian Wilde

doi:10.1117/12.2596669

11 November 2021 Brilliant light for materials science: industrial applications of synchrotron radiation-based microtomography at the tomography instruments by GEMS at PETRA III

Marc Thiry, Felix Beckmann, Jörg U. Hammel, Julian P. Moosmann, Fabian Wilde

Author Affiliations +

Proceedings Volume 11840, Developments in X-Ray Tomography XIII; 118400V (2021) https://doi.org/10.1117/12.2596669
Event: SPIE Optical Engineering + Applications, 2021, San Diego, California, United States

Abstract

GEMS is the user platform of Helmholtz-Zentrum Geesthacht with a unique infrastructure for complementary research with photons and neutrons. The instruments using synchrotron radiation are operated at DESY in Hamburg, the instruments using neutrons are located at the research reactor FRM II of the Heinz Maier-Leibnitz Center (MLZ) in Garching near Munich. GEMS provides methods for applied materials research to user groups from both industry and science. At the PETRA III synchrotron storage ring of the German Electron Synchrotron (DESY), GEMS operates instruments for tomographic analyses from the micro- to the nanoscale. The high-energy tomography station of the beamline HEMS/P07 uses photon energies from 50 to 200 keV. A robot sample changer enables automated high-throughput measurements. The beamline is therefore of special interest for industrial users, especially from the metal industry sector. In this contribution we introduce the tomography set-up at HEMS and the possibilities for industrial access, together with examples for tomography of challenging highly-absorbing samples.

Conference Presentation

Citation Download Citation

Marc Thiry, Felix Beckmann, Jörg U. Hammel, Julian P. Moosmann, and Fabian Wilde "Brilliant light for materials science: industrial applications of synchrotron radiation-based microtomography at the tomography instruments by GEMS at PETRA III", Proc. SPIE 11840, Developments in X-Ray Tomography XIII, 118400V (11 November 2021); https://doi.org/10.1117/12.2596669

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available