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Emissivity is one of the important parameters to reflect the thermal characteristics of the surface of an object. It plays a great role in the research of infrared coatings with high or low emissivity. In this paper, a novel non-contact experimental method is proposed to measure the coating’s emissivity using the dual-temperature method, and the error of the measured infrared emissivity with different base board materials is analyzed.
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Gangbo Hu, Zhuoqiao Wu, Xue Yang, Ning Tao, Cunlin Zhang, "Emissivity measurement with the dual-temperature method," Proc. SPIE 11906, Infrared, Millimeter-Wave, and Terahertz Technologies VIII, 119061C (9 October 2021); https://doi.org/10.1117/12.2602730