Presentation + Paper
25 May 2022 Impacts of process flow, scaling, and variability on interconnect performance
K. Egelhofer Ruegger, P. Nanja, M. Hargrove
Author Affiliations +
Abstract
Virtual fabrication is used to evaluate the performance of interconnects (line and via resistance, capacitance, etc.) across pitches compatible with either EUV single exposure or SADP for three different process flows: single damascene, dual damascene, and semi-damascene (subtractive metal etch). The effects of process variation for the three flows are also investigated to determine the relative importance of process flow, variation, and scaling when moving toward aggressive pitch interconnects.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. Egelhofer Ruegger, P. Nanja, and M. Hargrove "Impacts of process flow, scaling, and variability on interconnect performance", Proc. SPIE 12055, Advances in Patterning Materials and Processes XXXIX, 120550L (25 May 2022); https://doi.org/10.1117/12.2612591
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KEYWORDS
Metals

Resistance

Line edge roughness

Etching

Capacitance

Copper

Optical lithography

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