Paper
19 November 2021 Extension of Scheimpflug principle in multi-line laser scanning measurement
Author Affiliations +
Proceedings Volume 12059, Tenth International Symposium on Precision Mechanical Measurements; 120590J (2021) https://doi.org/10.1117/12.2611660
Event: Tenth International Symposium on Precision Mechanical Measurements, 2021, Qingdao, China
Abstract
Scheimpflug principle is a description of the geometric relationship between the orientation of the plane of sharp focus, the lens plane, and the image plane of an optical system, when the three planes intersect along a common line, which is widely applied in single line laser scanning measurement. We extend Scheimpflug principle to multi-line laser scanning measurement to enlarge the depth of field in a specific orientation and leverage its strengths of high measurement efficiency in the meanwhile. The two classic scenarios of multi-line laser are theoretically analyzed with the construction of measurement model. Our experimental results verify the measurement model and prove the increase of depth of field in the measurement direction.
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maosen Wan, Shuaidong Wang, Xiang Zhang, Huakun Jia, and Liandong Yu "Extension of Scheimpflug principle in multi-line laser scanning measurement", Proc. SPIE 12059, Tenth International Symposium on Precision Mechanical Measurements, 120590J (19 November 2021); https://doi.org/10.1117/12.2611660
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KEYWORDS
Laser scanners

3D metrology

Laser systems engineering

Reverse modeling

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