Paper
30 January 2022 Effect of electrodes material on the I-V-curve and switching of memristors on the base of electroformed open metal-SiO2-metal sandwich structure
Author Affiliations +
Proceedings Volume 12157, International Conference on Micro- and Nano-Electronics 2021; 121570D (2022) https://doi.org/10.1117/12.2622539
Event: International Conference on Micro- and Nano-Electronics 2021, 2021, Zvenigorod, Russian Federation
Abstract
The study of electroforming processes in various open sandwich metal-SiO2-metal structures (with different materials of electrodes) and I–V-curves at both voltage polarities allowed to find the main factor responsible for the presence of stable electroforming and the absence of breakdowns after electroforming (N-shape I-V-curve can be drawn repeatedly). This factor is making of structure anode of tungsten at any (top or bottom) position of this electrode. The use of molybdenum instead of tungsten in such structures essentially allows to decrease the electroforming voltage (from 10-11 to 4-5 V), which makes the process more reliable.
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S. E. Kudryavtsev, V. M. Mordvintsev, V. V. Naumov, and E. S. Gorlachev "Effect of electrodes material on the I-V-curve and switching of memristors on the base of electroformed open metal-SiO2-metal sandwich structure", Proc. SPIE 12157, International Conference on Micro- and Nano-Electronics 2021, 121570D (30 January 2022); https://doi.org/10.1117/12.2622539
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KEYWORDS
Electrodes

Tin

Oxides

Tungsten

Dielectrics

Molybdenum

Silica

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