Optimizing coded patterns with various lengths

Jaelin Lee; Byeungwoo Jeon

doi:10.1117/12.2626134

30 April 2022 Optimizing coded patterns with various lengths

Jaelin Lee, Byeungwoo Jeon

Author Affiliations +

Proceedings Volume 12177, International Workshop on Advanced Imaging Technology (IWAIT) 2022; 121770Q (2022) https://doi.org/10.1117/12.2626134
Event: International Workshop on Advanced Imaging Technology 2022 (IWAIT 2022), 2022, Hong Kong, China

Abstract

The performance of coded exposure photography-based image deblurring highly depends on its coded pattern to use. Conventionally, the length of the coded pattern has been optimized under the assumption that its length is equal to the length of motion blur. However, coded patterns of different lengths from the same motion blur may have better invertibility than the conventional patterns. In this paper, we investigate a method to optimize the coded pattern within an extended range of length candidates. We demonstrate the effectiveness of the proposed method using a real dataset.

Citation Download Citation

Jaelin Lee and Byeungwoo Jeon "Optimizing coded patterns with various lengths", Proc. SPIE 12177, International Workshop on Advanced Imaging Technology (IWAIT) 2022, 121770Q (30 April 2022); https://doi.org/10.1117/12.2626134

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE