Paper
10 October 2023 Modified DeepLabV3+ algorithm for casting defect detection
Yutong Fu, Min Li, Bingbing Xie, Jiyuan Huang
Author Affiliations +
Proceedings Volume 12799, Third International Conference on Advanced Algorithms and Signal Image Processing (AASIP 2023); 1279911 (2023) https://doi.org/10.1117/12.3006059
Event: 3rd International Conference on Advanced Algorithms and Signal Image Processing (AASIP 2023), 2023, Kuala Lumpur, Malaysia
Abstract
The occurrence of internal defects is inevitable in the casting process. It affects the reliability and durability of products and even gives rise to potential economic losses and security issues. Therefore, it appears essential to identify and eliminate defects in time. Deep learning algorithms can acquire more effective feature representation in complex scenes. Hence, a lightweight modified DeepLabV3+ algorithm is proposed with the following improvements. First, the ImageNet pre-trained MobileNetV2 is adopted as the backbone network to enhance the model feature extraction and improve the detection speed. Second, the atrous spatial pyramid pooling (ASPP) module is constructed for multi-scale feature fusion using atrous separable convolutions with different dilation rates. Third, the decoder is modified to fuse feature maps of different levels. Moreover, efficient channel attention modules are introduced to obtain more effective features and thus improve the defect edge segmentation effect. Last, a hybrid loss function of Focal Loss and Lovaszsoftmax Loss is used to reduce the influence of sample imbalance on model performance. The experimental results show that compared with the classical algorithms, the modified algorithm has higher accuracy and efficiency in the X-ray casting defect segmentation dataset CDSXray with less computational complexity.
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Yutong Fu, Min Li, Bingbing Xie, and Jiyuan Huang "Modified DeepLabV3+ algorithm for casting defect detection", Proc. SPIE 12799, Third International Conference on Advanced Algorithms and Signal Image Processing (AASIP 2023), 1279911 (10 October 2023); https://doi.org/10.1117/12.3006059
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KEYWORDS
Image segmentation

Semantics

Defect detection

Image processing

Deep learning

Computer vision technology

Industrial applications

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