Coherence property measurement of MEMS-VCSELs for SS-OCT based on the depth dependence of the noise floor

Maimi Shimura; Akira Takada; Makoto Fujino

doi:10.1117/12.2691995

12 March 2024 Coherence property measurement of MEMS-VCSELs for SS-OCT based on the depth dependence of the noise floor

Maimi Shimura, Akira Takada, Makoto Fujino

Author Affiliations +

Proceedings Volume 12830, Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XXVIII; 1283006 (2024) https://doi.org/10.1117/12.2691995
Event: SPIE BiOS, 2024, San Francisco, California, United States

Conference Poster

Abstract

We propose a new method to evaluate coherence properties of wavelength-swept light sources for the optical coherence tomography. The method relies on the depth variation of the noise floor and allows to estimate long coherence length with a limited electrical bandwidth unlike the conventional sensitivity roll-off method. By fitting the theoretically predicted noise-floor variation to the experimental data, we have successfully obtained coherence lengths of 1.6, 0.51, and 0.15m for a microelectromechanically tunable vertical-cavity surface-emitting laser with the sweeping rates of 100, 200, and 400kHz, respectively. The coherence lengths are comparable with those obtained with the roll-off method when the coherence lengths are relatively short.

Citation Download Citation

Maimi Shimura, Akira Takada, and Makoto Fujino "Coherence property measurement of MEMS-VCSELs for SS-OCT based on the depth dependence of the noise floor", Proc. SPIE 12830, Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XXVIII, 1283006 (12 March 2024); https://doi.org/10.1117/12.2691995

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