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We introduce a novel method of isolating carrier dynamics in optically excited semiconductors using optical-pump terahertz-probe spectroscopy, with a large external magnetic field to isolate different carrier types based on their cyclotron energies. We employ new echelon-based single-shot detection that utilizes a pair of 1D line array detectors which can read out at a 1 kHz repetition rate, reducing acquisition time by more than an order of magnitude. This enables collection of full 2D optical-pump/THz-probe scans at different magnetic fields. We demonstrate these capabilities by performing cyclotron resonance measurements in bulk silicon, and discover distinct carrier dynamics for electrons and holes, as well as their dependence on an external magnetic field.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Blake S. Dastrup,Peter R. Miedaner,Zhuquan Zhang, andKeith A. Nelson
"Resolving individual carrier dynamics with kHz single-shot optical-pump terahertz-probe spectroscopy in high magnetic fields", Proc. SPIE 12870, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications IX, 1287005 (12 March 2024); https://doi.org/10.1117/12.3005994
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Blake S. Dastrup, Peter R. Miedaner, Zhuquan Zhang, Keith A. Nelson, "Resolving individual carrier dynamics with kHz single-shot optical-pump terahertz-probe spectroscopy in high magnetic fields," Proc. SPIE 12870, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications IX, 1287005 (12 March 2024); https://doi.org/10.1117/12.3005994