Optimal freeform correctability for prism spectrometer system design with mixed ray-tracing method

Ziyao Tang; Herbert Gross

doi:10.1117/12.3016401

17 June 2024 Optimal freeform correctability for prism spectrometer system design with mixed ray-tracing method

Ziyao Tang, Herbert Gross

Proceedings Volume 13019, Optical Design and Engineering IX; 130191P (2024) https://doi.org/10.1117/12.3016401
Event: SPIE Optical Systems Design, 2024, Strasbourg, France

Abstract

The correction of spatial and spectral resolution in imaging spectrometer systems is of great importance due to their significant impact on efficiency and quality. During the design process, the resolution and distortion are both essential for imaging spectrometer performance analysis and correction. In a spectrometer system, the prism or the grating usually break the rotational symmetry, causing problems in aberration correction. Therefore, freeforms can be introduced in such systems to improve the imaging performance with the additional degrees of freedom. Concerning the high-order surface deviation and the symmetry-free system structure, the mixed ray-tracing method is applied for a comprehensive aberration analysis. The results calculated with the method help for optical design with a clear visualization of surface-decomposed aberration contributions. In case of freeform application, the method is considered as a reliable tool for a better understanding of the imaging performance.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Ziyao Tang and Herbert Gross "Optimal freeform correctability for prism spectrometer system design with mixed ray-tracing method", Proc. SPIE 13019, Optical Design and Engineering IX, 130191P (17 June 2024); https://doi.org/10.1117/12.3016401

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