CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 13104 > Article
Paper
18 March 2024 Structural and optical characteristics of InAs0.02Sb0.82N0.16 thick epilayers grown by melt epitaxy
Yuzhu Gao, Zun Tian Chen, Yasuhiro Hayakawa
Author Affiliations +
Proceedings Volume 13104, Advanced Fiber Laser Conference (AFL2023); 1310412 (2024) https://doi.org/10.1117/12.3021773
Event: Advanced Fiber Laser Conference (AFL2023), 2023, Shenzhen, China
Abstract
InAs0.02Sb0.82N0.16 thick epilayers have been grown on InAs substrates by melt epitaxy (ME) technology. Fourier transform infrared (FTIR) transmission spectra showed that the cutoff wavelength of InAs0.02Sb0.82N0.16 samples grown by ME is 10.0 μm indicating the band gap narrowing. The thickness of the epilayers grown by ME observed by scanning electron microscopy (SEM) reaches 183 μm. X-ray diffraction (XRD) measurements confirmed that the epilayers are single crystals. The full-width at half-maximum (FWHM) of InAs0.02Sb0.82N0.16 (400) CuKα1 diffraction peak is 298.8 arcsec. The high quality of the crystals benefits from the thickness of the epilayers exceeding 100 μm, which significantly suppresses the effect of the lattice mismatch between InAs0.02Sb0.82N0.16 epilayers and InAs substrates. Energy dispersive spectrometer (EDS) attached SEM measurements revealed that 16% nitrogen has been incorporated in the epilayers.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Yuzhu Gao, Zun Tian Chen, and Yasuhiro Hayakawa "Structural and optical characteristics of InAs0.02Sb0.82N0.16 thick epilayers grown by melt epitaxy", Proc. SPIE 13104, Advanced Fiber Laser Conference (AFL2023), 1310412 (18 March 2024); https://doi.org/10.1117/12.3021773
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 5 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Scanning electron microscopy
Spectroscopy
X-ray diffraction
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top