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18 March 2024 Degradation mechanisms of total ionizing dose effect in photocouplers
Yujuan He, Tianzi Liu, Teng Ma, Hong Zhang, Xu Tan, Zhifeng Lei, Chao Peng, Zhangang Zhang, Yuebo Liu
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Proceedings Volume 13104, Advanced Fiber Laser Conference (AFL2023); 131046I (2024) https://doi.org/10.1117/12.3023785
Event: Advanced Fiber Laser Conference (AFL2023), 2023, Shenzhen, China
Abstract
This article investigates the degradation mechanisms of total ionizing dose (TID) effects in photocouplers under different bias conditions. The irradiation measurement of silicon-based photocoupler devices is carried out by using a 60Co γ-ray source under various radiation bias conditions. The results of the test indicate that the current transfer rate (CTR) of the photocoupler reduces with an increase in the total dose. In addition, the non-luminous traps produced by the TID irradiation in the diffusion region of the PN junction of the light-emitting diode within the photocoupler cause more severe total dose effects when the input current of the device is low. This could be attributed to the charges being captured more easily in such scenarios. These representative results support the reliable application of the photocoupler devices in space radiation environments.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Yujuan He, Tianzi Liu, Teng Ma, Hong Zhang, Xu Tan, Zhifeng Lei, Chao Peng, Zhangang Zhang, and Yuebo Liu "Degradation mechanisms of total ionizing dose effect in photocouplers", Proc. SPIE 13104, Advanced Fiber Laser Conference (AFL2023), 131046I (18 March 2024); https://doi.org/10.1117/12.3023785
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KEYWORDS
Ionizing radiation
Reliability
Radiation effects
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