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30 September 2024 Correlations of interface charge accumulation and device characteristics studied by DCM-PL technique
Yutaka Noguchi, Mihiro Takeda, Shotaro Nakano, Alexander Hofmann, Wolfgang Bruetting
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Proceedings Volume 13122, Organic and Hybrid Light Emitting Materials and Devices XXVIII; 131220Z (2024) https://doi.org/10.1117/12.3027233
Event: Organic Photonics + Electronics, 2024, San Diego, California, United States
Abstract
Spontaneous orientation polarization (SOP) results in excess charge accumulation at the interfaces within OLEDs. The excess charge accumulation leads to significant exciton-polaron quenching (EPQ) and correlates to the device degradation. While SOP is observed in various OLED materials, the optimized SOP configuration remains not well understood. In this study, we demonstrated the correlations of the interface charge accumulation and device characteristics, particularly focusing on EPQ and device degradation, by the simultaneous measurement technique of displacement current and photoluminescence intensity (DCM-PL).
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Yutaka Noguchi, Mihiro Takeda, Shotaro Nakano, Alexander Hofmann, and Wolfgang Bruetting "Correlations of interface charge accumulation and device characteristics studied by DCM-PL technique", Proc. SPIE 13122, Organic and Hybrid Light Emitting Materials and Devices XXVIII, 131220Z (30 September 2024); https://doi.org/10.1117/12.3027233
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KEYWORDS
Interfaces
Doping
Organic light emitting diodes
Materials properties
Quenching
Luminous efficiency
Molecules
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