A method for selecting crossline two point sequential grounding fault lines for reliability enhancement

Lei Xia; Hai Wu; Qi Huang; Cheng Zhou

doi:10.1117/12.3030119

5 June 2024 A method for selecting crossline two point sequential grounding fault lines for reliability enhancement

Lei Xia, Hai Wu, Qi Huang, Cheng Zhou

Author Affiliations +

Proceedings Volume 13163, Fourth International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2024); 1316339 (2024) https://doi.org/10.1117/12.3030119
Event: International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2024), 2024, Xi'an, China

Abstract

At present, the detection technology for single-phase grounding faults in small current grounding systems has gradually matured, and the on-site application effect is gradually improving. However, there is relatively little research on the consecutive grounding faults at two points across the line. This article focuses on the transient characteristics of two consecutive grounding faults with the same and different phases in a small current grounding system. A transient equivalent circuit model is established, and the transient characteristics of single-phase grounding fault lines are analyzed. The variation law of transient characteristics of fault lines with different fault conditions is obtained. Based on this, a cross line two point sequential grounding fault line selection method based on continuous detection of fault transient quantities is proposed, and the correctness and feasibility of the proposed method are verified through digital simulation.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Lei Xia, Hai Wu, Qi Huang, and Cheng Zhou "A method for selecting crossline two point sequential grounding fault lines for reliability enhancement", Proc. SPIE 13163, Fourth International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2024), 1316339 (5 June 2024); https://doi.org/10.1117/12.3030119

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE