Development of desktop, integrated, and convenient laser-induced damage threshold measurement instrument

Yifan Chen; Xiangyue Zheng; Chunling He; Lei Chen; Dongyue Yan; Yihang Zhou; Hongfei Jiao; Jinglong Zhang; Bin Ma

doi:10.1117/12.3032711

17 December 2024 Development of desktop, integrated, and convenient laser-induced damage threshold measurement instrument

Yifan Chen, Xiangyue Zheng, Chunling He, Lei Chen, Dongyue Yan, Yihang Zhou, Hongfei Jiao, Jinglong Zhang, Bin Ma

Author Affiliations +

Proceedings Volume 13190, Laser-Induced Damage in Optical Materials 2024; 131900T (2024) https://doi.org/10.1117/12.3032711
Event: SPIE Laser Damage, 2024, San Ramon, CA, United States

Conference Poster

Abstract

The laser-induced damage threshold (LIDT) is a critical parameter affecting the performance of high-power laser systems. In LIDT testing, laser type, operating conditions, and measurement parameters frequently require adjustment according to specific testing needs, making the development of a versatile system with rapid parameter-switching capabilities essential. Building upon previous automated LIDT measurement systems, we have developed a desktop, integrated, and convenient LIDT measurement instrument based on international standards. This desktop design enables flexible switching between nanosecond pulsed and continuous-wave lasers, allowing for standardized, fully automated testing while accommodating multiple measurement protocols. This system is capable of detecting minute defects in tested components and assessing the stability of damage growth points. Additionally, integrated control software developed in LabVIEW facilitates highly accurate, synchronized acquisition and storage of multiple beam parameters in real time, correlating parameters of each laser pulse, damage images, and data processing. The system also provide s a range of integrated functionalities, including sample angle adjustment, front and rear surface identification, damage site reinspection, and automated report generation.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Yifan Chen, Xiangyue Zheng, Chunling He, Lei Chen, Dongyue Yan, Yihang Zhou, Hongfei Jiao, Jinglong Zhang, and Bin Ma "Development of desktop, integrated, and convenient laser-induced damage threshold measurement instrument", Proc. SPIE 13190, Laser-Induced Damage in Optical Materials 2024, 131900T (17 December 2024); https://doi.org/10.1117/12.3032711

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