Research on temperature compensation algorithm of turbidity sensor based on GaAlAs Infrared scattering theory

Shuwang Chen; Yifei Ma; Yajiang Chen

doi:10.1117/12.3035884

20 November 2024 Research on temperature compensation algorithm of turbidity sensor based on GaAlAs Infrared scattering theory

Shuwang Chen, Yifei Ma, Yajiang Chen

Author Affiliations +

Proceedings Volume 13241, Optical Metrology and Inspection for Industrial Applications XI; 132410A (2024) https://doi.org/10.1117/12.3035884
Event: SPIE/COS Photonics Asia, 2024, Nantong, Jiangsu, China

Abstract

In the process of water turbidity detection, in order to eliminate the significant influence of water temperature on turbidity measurement values, this study investigates a temperature compensation algorithm. By utilizing the GaAIAs infrared scattering principle, a water turbidity sensor was designed. The working principle is based on optical scattering theory. It utilizes a 880nm GaAIAs IRED semiconductor light-emitting element to emit light sources. By detecting the intensity of scattered light generated when the infrared emission tube's light shines on suspended particles in water, the sensor achieves measurement of water turbidity values. After introducing the temperature compensation algorithm for fitting processing of data, the error range of the turbidity sensor data is greatly reduced, which significantly improves its accuracy performance. Besides the interference caused by bubbles, the turbidity sensor based on GaAIAs IRED has been optimized for comparison values in the Formazin standard solution. This enables the sensor to effectively offset the influence of temperature changes on measurement results, demonstrating higher resistance to temperature interference.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Shuwang Chen, Yifei Ma, and Yajiang Chen "Research on temperature compensation algorithm of turbidity sensor based on GaAlAs Infrared scattering theory", Proc. SPIE 13241, Optical Metrology and Inspection for Industrial Applications XI, 132410A (20 November 2024); https://doi.org/10.1117/12.3035884

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