Preliminary study of the influence of the parameters of the piezoelectric element on the possible piezoaxionic effect

Patrice Salzenstein; Mahmoud Addouche; Frédéric Lefebvre

doi:10.1117/12.3036695

20 November 2024 Preliminary study of the influence of the parameters of the piezoelectric element on the possible piezoaxionic effect

Patrice Salzenstein, Mahmoud Addouche, Frédéric Lefebvre

Author Affiliations +

Proceedings Volume 13241, Optical Metrology and Inspection for Industrial Applications XI; 132411X (2024) https://doi.org/10.1117/12.3036695
Event: SPIE/COS Photonics Asia, 2024, Nantong, Jiangsu, China

Conference Poster

Abstract

The piezoaxionic effect was recently proposed to introduce a possible solution ensuring the detection of an elementary particle called axion predicted by theory. With our experience in research on the improvement and characterization of quartz oscillators and other materials allowing the propagation of acoustic waves. We are interested in contributing to the improvement of the precision of measurement means to determine if it is possible to have sufficient sensitivity for detecting effects of elementary particles which would be characteristic of dark matter. This potential effect of axions manifests through acoustic waves. We are interested in knowing the parameters which could potentially be a source of complications for this detection. This involves being able to estimate the knowledge of the accuracy and frequency stability used and the uncertainty terms which could affect the construction of an experimental device. Different piezoelectric materials are considered as candidates to help to highlight this piezoaxionic effect. We propose to present this work during the conference.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Patrice Salzenstein, Mahmoud Addouche, and Frédéric Lefebvre "Preliminary study of the influence of the parameters of the piezoelectric element on the possible piezoaxionic effect", Proc. SPIE 13241, Optical Metrology and Inspection for Industrial Applications XI, 132411X (20 November 2024); https://doi.org/10.1117/12.3036695

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