Recent developments in production of thin x-ray reflecting foils

Rene Hudec; Boris Valnicek; J. Cervencl; T. Gerstman; Adolf Van Inneman; Pavel Nejedly; Lubomir Svatek

doi:10.1117/12.23189

1 February 1991 Recent developments in production of thin x-ray reflecting foils

Rene Hudec, Boris Valnicek, J. Cervencl, T. Gerstman, Adolf Van Inneman, Pavel Nejedly, Lubomir Svatek

Proceedings Volume 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography; (1991) https://doi.org/10.1117/12.23189
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Progress in the development of high quality X-ray reflecting foils for high throughput X-ray imaging experiments is briefly given and discussed.

Citation Download Citation

Rene Hudec, Boris Valnicek, J. Cervencl, T. Gerstman, Adolf Van Inneman, Pavel Nejedly, and Lubomir Svatek "Recent developments in production of thin x-ray reflecting foils", Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); https://doi.org/10.1117/12.23189

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