Research on debris detection technology for aerospace electrical connectors

Lingqin Bai; Zanqin Wang; Dahuan Wang; Chaoqun Wang; Xiaolin Zhang

doi:10.1117/12.3055470

12 December 2024 Research on debris detection technology for aerospace electrical connectors

Lingqin Bai, Zanqin Wang, Dahuan Wang, Chaoqun Wang, Xiaolin Zhang

Author Affiliations +

Proceedings Volume 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024); 134391U (2024) https://doi.org/10.1117/12.3055470
Event: Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 2024, Xiamen, China

Abstract

Quality inspection of aerospace electrical connectors is one of the crucial safeguards for ensuring the safety of aerospace systems. However, the traditional method of manual sampling inspection struggles to meet the increasing production demands and carries the risk of undetected issues. This paper investigates the debris detection technology for aerospace electrical connectors based on machine vision and develops an automated vision inspection system to replace manual inspection for complex debris detection tasks in aerospace electrical connectors. In the study, based on the recognized pin points and same sequence pin alignment, the pin and the background of the printed line for the detection of debris are shielded, using the mask method and RANSAC algorithm, and the suspected debris region is extracted. Subsequently, the detection accuracy of the residual detection models obtained by different methods is compared, and the best-performing model, ShuffleNet-V2, is optimized. In the final test, the model trained by improved ShuffleNet-V2 network with the attention module ECA has the best detection effect with an accuracy of 99.2%.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Lingqin Bai, Zanqin Wang, Dahuan Wang, Chaoqun Wang, and Xiaolin Zhang "Research on debris detection technology for aerospace electrical connectors", Proc. SPIE 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 134391U (12 December 2024); https://doi.org/10.1117/12.3055470

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