Time-resolved x-ray scattering studies using CCD detectors

Roy Clarke; Waldemar Dos Passos; Walter P. Lowe; Brian G. Rodricks; Christine M. Brizard

doi:10.1117/12.23306

1 January 1991 Time-resolved x-ray scattering studies using CCD detectors

Roy Clarke, Waldemar Dos Passos, Walter P. Lowe, Brian G. Rodricks, Christine M. Brizard

Proceedings Volume 1345, Advanced X-Ray/EUV Radiation Sources and Applications; (1991) https://doi.org/10.1117/12.23306
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The advent of extremely bright x-ray beams from new low-emittance sources such as ESRF and APS offers new opportunities for materials research. One of the most exciting and technologically demanding areas is likely to be time-resolved x-ray studies. Our recent experiments at NSLS Brookhaven (Beamline X-16B) explore some of the challenges for time-resolved x-ray scattering combining developments in x-ray optics (dispersive geometry) area detectors (CCD''s) and fast data acquisition. The techniques are illustrated with results on the rapid thermal annealing of electronic materials including strained-layer InGai_As quantum-well structures. We describe the application of a new virtual-phase CCD detector for real-time diffraction studies at the microsecond time scale. 1.

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Roy Clarke, Waldemar Dos Passos, Walter P. Lowe, Brian G. Rodricks, and Christine M. Brizard "Time-resolved x-ray scattering studies using CCD detectors", Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, (1 January 1991); https://doi.org/10.1117/12.23306

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KEYWORDS

Charge-coupled devices

X-rays

Sensors

Scattering

Crystals

CCD image sensors

X-ray detectors

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